最大可進(jìn)行8個(gè)器件的測(cè)試。最大測(cè)試管腳數(shù)1024Pin 雖然有一定的限制，但是可以復(fù)數(shù)同時(shí)印加。是滿足日本、國(guó)際規(guī)格的高可靠性設(shè)備(滿足JEITA/ESDA/JEDEC規(guī)格)。可用于閂鎖測(cè)試，并適用脈沖電流法、電源過(guò)電壓、ESD印加法，也可通過(guò)DC測(cè)試判斷pass/fail，以及作為可添加選項(xiàng)，可以利用向量來(lái)進(jìn)行功能測(cè)試。

產(chǎn)品特性

最大可進(jìn)行8個(gè)器件的測(cè)試
最大測(cè)試管腳數(shù)1024Pin
滿足JEITA/ESDA/JEDEC規(guī)格
可用于閂鎖測(cè)試，并適用脈沖電流法·電源過(guò)電壓·ESD印加法

產(chǎn)品應(yīng)用

芯片封裝ESD測(cè)試

失效分析

規(guī)格參數(shù)

Model	HED-N5000
Capacity of power supply	256 and 512 pins 100V/15A，768 and 1024 pins 100V/20A
Pin number of max. measurement	256 pins，512 pins，768 pins and 1024 pins
Pulse zapping unit	MMx2 and HBMx2 are featured as standard
Pulse voltage	MM:10~±4000V，HBM:10~±8000V(Option)
Pulse voltage step	±5V
Pulse zapping number	1~99 times
Pulse interval	0.1~9.9s
Accuracy of charge voltage	1%±10V
Bias DC power supply	±35V/1A (Option available)
Vsupply over-voltage power ( for Latch-up test )	100V(1V step)
Vf/lm measurement power supply	±40V (0.1V step) /100mA (Option available)
Accuracy of Vf/lm measurement	1%±( 1/500FS±10nA)
Pulse current supply	±1A (1mA step)
Max count power supply	8
Wave form sampling ( for Latch-up test )	10MHz，Max.4000 points
Destruction judgement	Changing amount judgement/Absolute value judgement
Vector (Option)
Outer dimensions	1600mm(W)x900mm(D)x1500mm(H)
Weight	150 Kg~200 Kg
Basic software(OS)	Windows